Principles and applications of current techniques for the chemical, structural, and morphological characterization of engineering materials, with an emphasis on materials used in the microelectronics industry. Techniques studied include various electron and ion spectroscopies, electron microscopies, and diffraction techniques.
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2023 | ||||
2022 |
Matls Characterization (3c)
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2021 | ||||
2020 |
Matls Characterization (3c)
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2019 | ||||
2018 | ||||
2017 |
Matls Characterization (3c)
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2016 | ||||
2015 |
Matls Characterization (3c)
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2014 | ||||
2013 |
Matls Characterization (3c)
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2012 | ||||
2011 | ||||
2010 |
Matls Characterization (3c)
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2009 | ||||
2008 | ||||
2007 |
Matls Characterization (3c)
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2006 | ||||
2005 |
Matls Characterization (3c)
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2004 | ||||
2003 |
Matls Characterization (3c)
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2002 |
Matls Characterization (3c)
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2001 |
Matls Characterization (3c)
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2000 | ||||
1999 |
Matls Characterization (3c)
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1998 |