The physical operation of basic modern semiconductor devices and the determination of their internal parameters are discussed in detail. A review of semiconductor physics, including incomplete ionization, carrier lifetimes, and carrier transport, and solutions of continuity equation are presented. Devices include pn junction diodes, metal-oxide-semiconductor capacitors and field-effect transistors. Emphasis is placed on the fundamental mechanisms that contribute to device performance. The interrelationship between device parameters and circuit performance is also discussed.
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