# Semiconductor Device Characterization

## ECSE-6200

This graduate-level course is designed to give students a hands-on experience in the characterization of basic semiconductor devices (diffused resistors, pn junction diodes, Schottky diodes, MOS capacitors, bipolar junction transistors, MOSFETs) in wafer and/or packaged forms. The final project involves the students in a detailed characterization of devices in a specific application (e.g. high-voltage power electronics, submicron ULSI, microwave and wireless).

3 credits
Prereqs:
none

# Past Term Data
Offered
Not Offered
Offered as Cross-Listing Only
No Term Data
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Detailed View

| Spring | Summer | Fall
--- | --- | --- | ---
| (Session 1) | (Session 2) |
2023 |  |  |
2022 |  |  |
2021 |  |  |
2020 | Semiconductor Devise Characterization (3c) Tat-Sing Chow Seats Taken: 1/36 |  |
2019 | Semiconductor Devise Characterization (3c) Tat-Sing Chow Seats Taken: 2/36 |  |
2018 | Semiconductor Devise Characterization (3c) Tat-Sing Chow Seats Taken: 2/36 |  |
2017 | Semiconductor Devise Characterization (3c) Tat-Sing Chow Seats Taken: 9/36 |  |
2016 |  |  |
2015 | Semiconductor Device Char (3c) Tat-Sing Chow Seats Taken: 3/38 |  |
2014 |  |  |
2013 |  |  |
2012 |  |  |
2011 |  |  |
2010 |  |  |
2009 |  |  |
2008 |  |  |
2007 |  |  |
2006 |  |  |
2005 |  |  |
2004 |  |  |
2003 |  |  |
2002 |  |  |
2001 |  |  |
2000 |  |  |
1999 |  |  |
1998 |  |  |