# Semiconductor Devise Characterization

## ECSE-6200

This graduate-level course is designed to give students a hands-on experience in the characterization of basic semiconductor devices (diffused resistors, pn junction diodes, Schottky diodes, MOS capacitors, bipolar junction transistors, MOSFETs) in wafer and/or packaged forms. The final project involves the students in a detailed characterization of devices in a specific application (e.g. high-voltage power electronics, submicron ULSI, microwave and wireless).

3 credits
Prereqs:
none

# Past Term Data
Offered
Not Offered
Offered as Cross-Listing Only
No Term Data
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| Spring | Summer | Fall
--- | --- | --- | ---
| (Session 1) | (Session 2) |
2026 |  |  |

2025

Semiconductor Devise Characterization (3c)

- Tat-Sing Chow

Seats Taken: 0/15

2024 |  |  |
2023 |  |  |
2022 |  |  |
2021 |  |  |

2020

Semiconductor Devise Characterization (3c)

- Tat-Sing Chow

Seats Taken: 1/36

2019

Semiconductor Devise Characterization (3c)

- Tat-Sing Chow

Seats Taken: 2/36

2018

Semiconductor Devise Characterization (3c)

- Tat-Sing Chow

Seats Taken: 2/36

2017

Semiconductor Devise Characterization (3c)

- Tat-Sing Chow

Seats Taken: 9/36

2016 |  |  |

2015

Semiconductor Device Char (3c)

- Tat-Sing Chow

Seats Taken: 3/38

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