# Ic Metrology And Inspection

## ECSE-6307

In this survey level course students learn common metrology and inspection techniques for semiconductor manufacturing and yield enhancement. Students evaluate multiple techniques including optical and scanning electronic microscope (SEM) as well as automated techniques, for different stages of manufacturing from wafer processes to chip packaging.

? credits
Prereqs:
none

# Past Term Data
Offered
Not Offered
Offered as Cross-Listing Only
No Term Data
Simple View
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